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Bruker Introduces NPFLEX 3D Metrology System

Bruker Introduces NPFLEX 3D Metrology System

10/09/2010
Veeco Instruments

Measurements of surface texture, finish, roughness, waviness, curvature, and slope of large specimen with sub-nanometer accuracy are easily performed with the new NPFLEX 3D-Optical Surface Profiler System without the need to destroy them. Based on non-contact white-light interferometric technology. the NPFLEX was designed to measure large and bulky objects utilizing an open gantry that provides full access and allows custom fixturing and mounting.

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